IEEE VIS 2013 provides the premier forum for data and information visualization advances in academia, science, government, and industry. Three venues, the IEEE Visual Analytics Science and Technology Conference (VAST), the IEEE Information Visualization Conference (InfoVis) and the IEEE Scientific Visualization Conference (SciVis) will be co-located in Atlanta, GA, from Sunday, October 13, 2013 through Friday, October 18, 2013. These events bring together researchers and practitioners with a shared interest in tools, techniques and technology. A full complement of research presentations, tutorials, workshops, panels, demonstrations, posters and exhibitions make this conference one of the largest, and most important gatherings of researchers and professionals who specialize in the visual analysis of data.
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