Welcome to VisWeek 2011!

VAST Welcome

The IEEE Conference on Visual Analytics Science and Technology (IEEE VAST), founded in 2006, is the first international conference dedicated to advances in Visual Analytics Science and Technology. Previously named the ‘IEEE Symposium on Visual Analytics Science and Technology’, in 2011 IEEE VAST will be an IEEE Conference for the first time. The scope of the conference includes both fundamental research contributions within visual analytics as well as applications of visual analytics in science, security, investigative analysis, engineering, medicine, health, media, business, and social interaction. We invite you to participate in IEEE VAST 2011 by submitting your original research, application, or evaluation paper.

For questions, please email vast@visweek.org.